Atomic Force Microscopy for Nanotechnology, Scientific Research & Education

AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM
•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS
Fully automated AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force Microscope for Research & Education
New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: NEXT, NTEGRA Prima, NTEGRA Spectra,
SPECTRUM and LIFE systems
Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force Microscope integrated with Confocal Raman and  SNOM systems
Fully automated Atomic Force Microscope
integrated with Inverted Light Microscope
for Biological Research
LIFE – Fully automated Atomic Force Microscope integrated with Inverted Light Microscope
Automated AFM-Raman-SNOM system for a wide range of applications

San Antonio ,Texas. March, 2-6, 2015

Bilbao, Spain. March, 10-13, 2015
Bringing together Nanoscience & Nanotechnology

Berlin, Germany. March, 15-20, 2015
79th Annual Meeting of the DPG and DPG Spring Meeting

Dublin, Ireland. March, 18-20, 2015
Second Annual Conference on Optical Nanospectroscopy

Denver,Colorado. March, 22-26, 2015


On January 14th Combined AFM/Raman Webinar will take place.

A presentation of the Characterization of Materials with a Combined AFM/Raman Microscope will be introduced. Lecturer - Sergei Magonov NT-MDT America Inc, Tempe AZ 85284.

Webinar is supported by NT-MDT & Thermo Fisher Scientific Inc.

Archived webinars 
    Beyond the Diffraction Limit: AFM Integration with
   Please click here to view the webinar

Unique cantilever-type TERS* probes for nano-Raman imaging

Drawing of Atomic Force Microscopy technique HybriD ModeRecord Raman enhancement factors, highest nano-Raman spatial resolution and excellent AFM performance.

Together with the dedicated NT-MDT AFM-Raman-TERS equipment, the probes deliver complete high performance commercial TERS solution.
Read more

 * TERS: Tip Enhanced Raman Scattering (nano-Raman)
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