Atomic Force Microscopy for Nanotechnology, Scientific Research & Education

TITANIUM
AFM - Raman - SNOM
Bio AFM
Modular AFM
Automated AFM
Practical AFM
Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force Microscope integrated with Confocal Raman and  SNOM systems
Fully automated AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force Microscope for Research & Education
New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: TITANIUM, NEXT, NTEGRA Prima,
NTEGRA Spectra, SPECTRUM and LIFE systems
•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS
Fully automated Atomic Force Microscope
integrated with Inverted Light Microscope
for Biological Research
LIFE – Fully automated Atomic Force Microscope integrated with Inverted Light Microscope
Automated AFM-Raman-SNOM system for a wide range of applications
 
 
NT-MDT Company would like to invite you
to visit a unique lecture of doctor
Sergei Magonov, director of NT-MDT
Development company, USA.

Mr. Magonov will tell about advanced features of Atomic Force Microscopy (AFM): new resonance modes and high-resolution quantitative studies of mechanical and electric properties. Read more
 
Dr. Sergei Magonov
 
New ETALON series AFM probes with CoFe coating for ultra-high-resolution MFM
3x3 um AC-MFM image of high-density HDD surface reveals at least 30 nm resolution.
Read more
 
MFM image of HDD
 
 
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