Atomic Force Microscopy for Nanotechnology, Scientific Research & Education

AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM
Fully automated AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: NEXT, NTEGRA Prima, NTEGRA Spectra,
SPECTRUM and LIFE systems
Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force Microscope for Research & Education
Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force Microscope integrated with Confocal Raman and  SNOM systems
Fully automated Atomic Force Microscope
integrated with Inverted Light Microscope
for Biological Research
LIFE – Fully automated Atomic Force Microscope integrated with Inverted Light Microscope
Universal fully automated desktop
Atomic Force Microscope
Automated AFM-Raman-SNOM system for a wide range of applications

Dr. Sergei Magonov, the CEO of NT-MDT Development Co, gave an interview to AZoNano about new HybriDTM  AFM Mode.

Krakow, Poland. August, 17-22, 2014

Utah,USA. August 31 - September 4, 2014
Thirteenth International Conference on Near-Field Optics, Nanophotonics and Related Techniques

Toronto,Ontario,Canada. September, 2-6, 2014
International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials

Basic Principles of AFM Advanced Modes & Applications

The webinar took place on July 16, 2014.

The webinar will be available for download soon.

Planned webinars
Archived webinars
    Beyond the Diffraction Limit: AFM Integration with
   Please click here to view the webinar

HybriD Mode™ - Innovative Atomic Force Microscopy technique

Drawing of Atomic Force Microscopy technique HybriD Mode Innovative Atomic Force Microscopy HybriD Mode™ provides comprehensive information about your sample.

Morphological, mechanical, chemical, electrical, magnetic, and other characteristics are resolved within single measurement cycle with high spatial resolution.
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