NTEGRA platform: NTEGRA Solaris

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Nearfield optical SPM system NTEGRA Solaris

NTEGRA Solaris datasheet (650 KB)

Scanning near-field optical microscopy (SNOM) gives an ability to study optical properties of the sample (reflectivity, light transmission, light scattering) with the spatial resolution of tens of nanometer. In contrast to a common optical microscope, which resolution is restricted by the diffraction limits (near 170 nm for the blue light in the confocal conditions), the resolution of SNOM is determined only by the size of the aperture of the optical probe. It is a hole in the metal coating of the optical fiber tip, which is used as the channel for transferring the laser light to the sample.
There is a lens-holder with 100 µm Z-scanner in the interchangeable base of the system. The mechanical rigidity of the construction allows using immersion high-aperture lenses.