NTEGRA platform: NTEGRA Spectra

• General information
• Specification
• Applications
• Configurations

Raman spectroscopy AFM system NTEGRA Spectra

NTEGRA Spectra datasheet   (3 Mb)

	Inverted microscope configuration   (1.5 Mb) (for transparent samples)		Upright microscope configuration (0.8 Mb)(for opaque samples)
	Contact Mr. Andrew B. Shubin - VP Marketing E-mail: shubin@ntmdt.ru; Tel.: +7 495 913-57-36/37/38 Fax: +7 495 913-57-39 Mobile: +8 916 678-62-00.		NTEGRA Spectra system has won prestigious R&D 100 Award!

Confocal optical microscopy/spectroscopy system
NTEGRA Spectra nanolaboratory is a system that combines confocal scanning laser spectrometer, optical microscope and universal scanning probe microscope. The system is capable of working in the mode of registration of spatial 3D distribution of luminescence spectrum and Raman light scattering, as well as various scanning probe microscopy modes that include nanoindentation, nanomanipulation and nanolithography.

Scanning probe microscopy system
Along with the optical observation, NTEGRA Spectra allows investigating the object with a set of SPM methods: AFM, MFM, STM, Scanning Near-field Optical Microscopy, Force spectroscopy. The unique combination of optical and probe methods in one device allows carrying out complex experiments, which will provide the researcher with information on the distribution of optical properties and the object’s chemistry overlapped with the mechanical, electrical and magnetic properties data.

System for the investigation of optical properties beyond the diffraction limit
The distinguishing feature of NTEGRA nanolaboratory is the capability of studying optical properties of objects beyond the diffraction limits. Scanning Near-field Optical Microscopy and the effect of local tip enhanced Raman scattering provides the researcher with the tools for mapping the optical properties distribution (light transmission, light scattering, light polarization, etc.) as well as carrying out Raman scattering spectroscopy with flat XY resolution up to 50 nm.

More detailed description see in  :

1. "Focus on Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging".  Nanotechnology 18 (2007) 315502. (pdf,  1.7 Mb)
2. "Tip-enhanced Raman Spectroscopy and Imaging". Imaging & Microscopy v. 9 (2007) p. 56. (pdf,  2.6 Mb)