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Publications
07.11.2008
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Yu. M. Stryuchkova and E. V. Kasatkin
Scanning Tunneling Microscopic and Scanning Tunneling Spectroscopic Studies of Nanostructure and Surface Energy Properties of Stainless Steel #Kh18N10T. 1. Measurements at Interfaces with Air and 0.1 N HCl solution
ISSN 0033-1732, Protection of Metals, 2008, Vol. 44, No. 5, pp. 430–436. |
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22.10.2008
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H. Fischer, A. Nesci, G. Leveque & O.J.F. Martin.
Characterization of the polarization sensetivity anistropy a near-field using phase measurements.
Journal of Microscopy, Vol. 230. P.t. 1 2008. pp. 27-31 |
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10.10.2008
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Victor L. Mironov, Boris A. Gribkov, Dmitry S. Nikitushkin, Sergey A. Gusev, Sergey V. Gaponov, Andrey B. Shubin, Peter A. Zhdan, and Chris Binns
Magnetic Force Microscopy of Low-Coercivity Ferromagnetic Nanodiscs
IEEE TRANSACTIONS ON MAGNETICS, VOL. 44, NO. 10, OCTOBER 2008. |
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15.05.2008
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P. Zolotavin, E. Permenova, O. Sarkisov, V. Nadtochenko, R. Azouani, P. Portes, K. Chho, A. Kanaev. Chemical Physics Letters 457 (2008) 342–346. Two-photon luminescence enhancement of silver nanoclusters photodeposited onto mesoporous TiO2 film. |
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20.04.2008
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A. A. Fraerman, B. A. Gribkov, S. A. Gusev, A. Yu. Klimov, V. L. Mironov, D. S. Nikitushkin, V. V. Rogov, S. N. Vdovichev, B. Hjorvarsson, and H. Zabel3 Magnetic force microscopy of helical states in multilayer nanomagnets JOURNAL OF APPLIED PHYSICS 103, 073916, 2008 |
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02.04.2008
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H. Fisher, A. Nesci, G. Leveque & O. J.F. Martin.
Characterization of the polarization sensitivity anisotropy of a near-field probe using phase measurements.
Journal of Microscopy, Vol. 230, Pt 1 2008, pp. 27–31. |
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20.03.2008
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В.М. Грабов, Е. В. Демидов, В.А. Комаров.
Атомно-силовая микроскопия пленок висмута.
Физика твердого тела, 2008, том 50, вып. 7. |
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17.03.2008
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W. WANG, P. CISELLI, E. KUZNETSOV, T. PEIJS, A. H. BARBER.
Effective reinforcement in carbon nanotube–polymer composites.
Published online |
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17.03.2008
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A. Alexeev, J. Loos
Conductive atomic force microscopy (C-AFM)analysis of photoactive layers in inert atmosphere.
Organic Electronics 9 (2008) |
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17.03.2008
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F. V. Tikhonenko, D. W. Horsell, R. V. Gorbachev, and A. K. Savchenko
Weak localization in graphene flakes.
arXiv:0707.0140v2 [cond-mat.mes-hall] 11 Jan 2008 |
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